Joint procurement with Fraunhofer (Germany) for a PVD-Sputter-Cluster (IMS-01) – Negotiated with prior publication of a call for competition / competitive with negotiation

Joint procurement with Fraunhofer (Germany) for an iLineStepper (ENAS-02.1) – Negotiated with prior publication of a call for competition / competitive with negotiation.

Joint procurement with Fraunhofer (Germany) for a ALD System (Dielectric) (IPMS-CNT06.1) - PR1017835-2480-P– Negotiated with prior publication of a call for competition / competitive with negotiation

Joint procurement with IHP (Germany) for a Standard Cleaning Batch Tool for 130 nm Technology on 200mm Si wafers (IHP-04) – Open Procedure

Joint procurement with INL (Portugal) for a High Repetition Rate Femto-second Laser (INL-07) – Open Procedure

Joint procurement with INL (Portugal) for a High Power Femto-second Laser (INL-08) – Open Procedure

Joint procurement with Fraunhofer (Germany) for a PVD metal system for QMI connection (IPMS-MRS12.1) – Negotiated with prior publication of a call for competition / competitive with negotiation.

Joint procurement with Fraunhofer (Germany) for an Inline XPS/XRF (IPMS-CNT03.1)– Negotiated with prior publication of a call for competition / competitive with negotiation.

Joint procurement with FhG (Germany) for a PVD Clustertool (IZM-23.1) – Open procedure

Joint procurement with FhG (Germany) for a Laser Plasma Dicer (IZM-25.1) – Open Procedure

Joint procurement with FhG (Germany) for a Resist/Polymer Coater (IZM-09.1) – Open Procedure

Joint procurement with FhG (Germany) for an 300mm XRD (IPMS-CNT07.2) – Negotiated with prior publication of a call for competition / competitive with negotiation.

Joint procurement with FhG (Germany) for a Wafer Prober (IMS-04) – Negotiated with prior publication of a call for competition / competitive with negotiation.

Joint procurement with FhG (Germany) for a PVD-Sputter-Cluster for dielectric materials (IMS-01) – Negotiated with prior publication of a call for competition / competitive with negotiation

Joint procurement with Fraunhofer (Germany) for a 3D LIT-OBIRCH system (IMWS-2.1) and Scanning Electron Microscope with ultrafast e-beam operation (IMWS-3.1 )– Negotiated with prior publication of a call for competition / competitive with negotiation

Joint procurement with Fraunhofer (Germany) for an Precise ion beam based trenching tool (IMWS-03.2) + high performance Ga-FIB sample preparation (IMWS-08.1) + high performance analytical SEM inspection (IMWS-08.2) – Negotiated with prior publication of a call for competition / competitive with negotiation.

Joint procurement with Fraunhofer (Germany) for an Thermo reflectance microscope (IMWS-01.1) – Open Procedure.

Joint procurement with Fraunhofer (Germany) for an “IZM-01 // High Precision bonder for wafer and chiplet level assembly” – Open Procedure.

Joint procurement with Fraunhofer (Germany) for an IPMS-MRS07.2; IPMS-MRS08.1; IPMS-MRS08.2) // DRIE etch cluster (Mainframe + 3 Chambers) – Negotiated with prior publication of a call for competition / competitive with negotiation.

Joint procurement with Fraunhofer (Germany) for a High resolution inline electron microscope (IPMS-CNT09.1; IPMS-CNT09.4, IPMS-CNT09.5) – Negotiated with prior publication of a call for competition / competitive with negotiation.

Joint procurement with Fraunhofer (Germany) for a Ion Mill chamber with central handling system and 2 PVD chambers (ENAS-01.1)– Negotiated with prior publication of a call for competition / competitive with negotiation.

Joint procurement with Fraunhofer (Germany) for a CD-SEM Measurement System (IPMS-MRS03.1) – Negotiated with prior publication of a call for competition / competitive with negotiation

Joint procurement with Fraunhofer (Germany) for a Waferbonder (IZM-31) – Open procedure

Joint procurement with Fraunhofer (Germany) for an Inline 300 mm full wafer XRR (IPMS_CNT07.1) – Negotiated with prior publication of a call for competition / competitive with negotiation

Joint procurement with Fraunhofer (Germany) for an Analytic-Prober (IPMS-MRS11.4)– Negotiated with prior publication of a call for competition / competitive with negotiation

Joint procurement with Fraunhofer (Germany) for an Analytic-Test-System (IPMS-MRS11.3) – Negotiated with prior publication of a call for competition / competitive with negotiation

Joint procurement with Fraunhofer (Germany) for an Inline Testsystem (IPMS-MRS11.1)– Negotiated with prior publication of a call for competition / competitive with negotiation

Joint procurement with Fraunhofer (Germany) for a Trusted Execution Environment – Open procedure

Joint procurement with Fraunhofer (Germany) for a Test head with cards and manipulator – Open procedure

Joint procurement with Fraunhofer (Germany) for Lock-In Thermography System – Open procedure

Joint procurement with Fraunhofer (Germany) for Etch Cluster (ISIT05.1) - Negotiated procedure with prior publication of a call for competition / competitive with negotiation

Joint procurement with Fraunhofer (Germany) for ALD System (Dielectric + Metal) - Negotiated procedure with prior publication of a call for competition / competitive with negotiation

Joint procurement with Fraunhofer (Germany) for a WET Clean Equipment - Negotiated procedure with prior publication of a call for competition / competitive with negotiation